U/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch Projector

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model number
LS-MIG-5
Product Details
Customization: Available
After-sales Service: 1 Year
Warranty: 1 Year
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  • U/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch Projector
  • U/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch Projector
  • U/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch Projector
  • U/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch Projector
  • U/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch Projector
  • U/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch Projector
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Overview

Basic Info.

Model NO.
LS-MIG-5
Max Diameter of Workpiece
<500mm
Mass Scope of Workpiece
900kg
Type
Testing Machine
Maxcapacity
<1000KN
Accuracy Grade
1
Load Way
Electronic Load
Loading Method
Dynamic Load
Display
Digital
Control
Computer Control
Weight
100-500Kg
Power Source
AC220V
Oil Cylinder Position
Top
brand name
LANGSHUO
Power Supply
220 V
place of origin
Hunan, China
Model
LS-MIG-5
Transport Package
/
Specification
/
Trademark
LANGSHUO
Origin
Hunan, China
HS Code
9024800000
Production Capacity
200

Product Description

U/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch Projector

Overview

With the development of domestic industrial technology, more and more industries have begun to implement Charpy V2#U2#U3#U5 notch impact test method, at present, such as boiler pressure vessels, metallurgy and machinery manufacturing and other industries have generally adopted Charpy V notch impact test to replace the use of decades of Mei U-type notch impact test. For the Charpy V-notch impact test, due to the strict requirements of the sample V-notch (the sample notch depth is 2mm, the sample notch Angle is 45° and the sample notch tip is required to be R0.25mm±0.025mm), the key issue in the whole test process is whether the sample V-notch processing is qualified. If the sample notch processing quality is not qualified, Then the results of the test are not credible, especially the small change in the tip of the R0.25mm notch (its tolerance zone is only 0.025mm), will cause a huge steep jump in the test results, especially at the critical value of the test, will cause the product scrap or qualified two opposite different outcomes. In order to ensure the quality of Charpy V notch machining, the quality inspection of the notch machining is an important quality control means, and the optical projection magnification inspection is the only practical method to ensure the quality of the inspection.

 

LS-MIG-5 impact specimen notch imaging instrument is a special optical instrument designed and developed by us according to the actual needs of domestic users and the requirements of impact specimen notch in GB/ T229-2020 "Metal Charpy Notch Impact Test Method", which is dedicated to checking the quality of Charpy V and U impact specimen notch processing. By using optical imaging method, the impact sample V or U-shaped notch profile is amplified and transformed to the computer display screen, and the impact sample V and U-shaped notch standard sample are programmed to determine whether the notch processing of the tested impact sample is qualified. Its advantages are simple operation, intuitive inspection and comparison, and high efficiency.

 

In short, the imaging instrument is the necessary special equipment for the physical and chemical laboratory of the majority of metallurgy, boiler pressure vessel, vehicle and ship engineering machinery manufacturing and scientific research departments.

 

The instrument can also be used for the contour of mechanical parts, textile fibers, biological slice analysis, workloads and cutting tools inspection, instrument components and semiconductor device projection detection.

 

Working principle

This imager is a new measurement technology. The product contour is reduced tens of times through the telecenter lens and then transferred to the five million pixel high-resolution CCD camera for digital processing. Then the background mapping and measurement software with powerful computing power can quickly capture the product contour according to pre-programmed instructions. Finally, the product size is calculated by comparing with the scale formed by the small pixel points of the high pixel camera, and the dimensional tolerance is evaluated.
 

U/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch Projector

The main parameters

1. Display size

 15 inches

2, table size

Square table size: 110×125mm

Square table diameter

 90mm

Table glass diameter

 70mm

3, table stroke

Longitudinal: ±10mm

Horizontal

 ±10mm

Lift

 ±12mm

4, table rotation range

 0 ~ 360°

5, camera capture pixels

 5 million

Objective magnification

 2.5X

Projection objective magnification

 20x

6, light source (LED)

 12V 100W

7. Power supply

 220V 50Hz

8, the main machine dimensions

 450×350×650mm

9. Total weight

26kg

 

Structural composition

LS-MIG-5 impact specimen notch imager

1. Housing  2. Display  3. Objective lens  4 .Industrial camera  5 .Round workbench  6 .square workbench  7 .Longitudinal adjustment handwheel   8 .Transverse adjustment handwheel  9. Base  10. Power switch  11. foot screw  12. Power indicator  13 .lifting hand wheel;

 
 
 
Company Information

U/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch ProjectorU/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch ProjectorU/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch ProjectorU/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch ProjectorU/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch ProjectorU/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch Projector

U/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch ProjectorU/V Impact Sample Notch Measuring Machine Impact Specimen U/v Notch Profile Projector Optical U/V Notch Projector

 

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