Customization: | Available |
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After-sales Service: | Online |
Warranty: | 1 Year |
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UCE UC2517 DC Low Resistance Tester UC2517A UC2517B UC2518 UC2518A
Brief Introduction
UC2517 can be used to test coil, inductor, transformer, voice coil, relay contact resistance, connector resistance, fuse, cable resistance, PCB resistance, welding resistance, conductive film, metal and so on. UC2517 is a kind of low resistance tester with high speed, high precision and high performance, which can meet the requirements of production line quality assurance, purchase inspection and laboratory measurement, it can be also used for automatic equipment test.
Performance Characteristics
Performance Characteristics
4.3 inch TFT LCD display, with 480×272 RGB resolution
It is more convenient for U disk to save the test results directly
Maximum resistance accuracy is 0.05%
Built-in comparator; HI, LO, IN can be sorted
More than 100 groups of internal setting files for storage or call, U disk can expand more than 500 groups of test files to save or call
The software version of the instrument can be upgraded and updated via USB HOST
U disk can support file systems with format FAT16, FAT32
Standard HANDLER, USB HOST, USBCDC, and USBTMC; Optional RS232C, GPIB interface
DC Low Resistance Tester
Technical Specifications
Measurement accuracy and function | ||
Basic accuracy |
0.05%+2 words,UC2517B basic accuracy is 0.1% (2MΩ range is 0.2%) |
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Measuring speed |
Power frequency: 50Hz,fast speed:22ms,medium speed:42 ms,slow speed:102 ms Power frequency :60Hz,fast speed:18.5ms,medium speed:35 ms,slow speed:102 ms The above shows the speed when the display is off , when the display is on, the display time is 10 ms. |
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Statistical functions | Provide CpK, Cp and other statistics | |
Range method | Automatic, hold, manual selection | |
Trigger method | Internal, external | |
Average times | 1-255 | |
Delay time | 0-9999ms, step :1ms | |
Calibration function |
Short circuit, zero, load correction |
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Test end configuration |
Four ends | |
Display method | Direct reading, Δ% |