Customization: | Available |
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After-sales Service: | online |
Warranty: | 1 year |
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Desktop XRD X-ray diffractometer cheap prices diffraction Analyzer tester
1. Product presentation
Designed for industrial production and quality control, it concentrates the advanced technology of X-ray diffractometer production, functionalized and miniaturized desktop X-ray diffractometer. It can accurately perform qualitative analysis, quantitative analysis and crystal structure analysis on metal and non-metal samples. It is especially suitable for catalyst, titanium dioxide, cement, pharmaceutical and other product manufacturing industries.
Desktop XRD X-ray diffractometer cheap prices diffraction Analyzer tester
2.Instrument performance description
1. The high-frequency and high-voltage X-ray emitter not only improves the stability of the instrument, but also ensures the repetitive accuracy of the measurement data;
2. The θs and θd arms of the goniometer adopt servo motor drive + optical encoding control technology, the goniometer rotates more smoothly, the diffraction angle measurement is more accurate, and the linearity is better. Within the diffraction angle measurement range, the diffraction angle linearity is less than 0.02;
3. The scattered radiation protection device is safer and more reliable. The radiation protection door is automatically prohibited from opening during sample measurement, which can prevent operators from being irradiated by scattered radiation under any circumstances;
4. The GA-2700 diffractometer is equipped with the most advanced metal ceramic X-ray tube with a long service life (guaranteed to work for 3000 hours); if equipped with an automatic 6-sample sample changer, the sample measurement speed can be increased, which is convenient for operators to use the instrument;
5. The compact size can be installed on the laboratory bench and does not require a specific laboratory environment. It is simple to use, operate and maintain.
Instrument usage description:
GA-2700 diffractometer can be used for qualitative and quantitative analysis of polycrystalline materials. In qualitative analysis, the instrument measurement data is compared with the known phase database to identify unknown structures. In quantitative analysis, it is used to describe the characteristics of solid mixtures and determine the relative content of crystalline compounds or uncrystallized phases.
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Service rating | 600W(40kV,15mA), Stability:0.005% (power fluctuation: 220Vac±15%) | ||||
X-ray tube | Metal-ceramic X-ray tube, Cu target, Power 2.4kW, Focus size:1 x 10 mm, water cooling(water flow rate >1L/min) | ||||
Goniometer | θs-θd , diffraction radius 150mm | ||||
Measuring method | Continuous, stepping, Omg | ||||
Angle measuring range | θs/θd linkage action -3°~150°. | ||||
Minimum step width | 0.0001° | ||||
Angle reproducibility | <=0.0005° | ||||
Angle Positioning speed | 1500°/min | ||||
Counter | Closed Proportional detector | ||||
Energy spectrum resolution | <25% | ||||
Max. linear counting rate | ≥5×105cps | ||||
Computer | DELL business notebook | ||||
Soft ware | Controlling software | Windows 10 operating system; automatic control on the tube voltage and current and shutter of the X-ray generator and tube aging training; Control the goniometer via continuous or stepping scanning and collecting diffraction data simultaneously; routine data processing: automatic peak-seeking, manual peaking-seeking, integrated intensity, peak height, core, background deduction, smoothness, Peak shape amplification and spectrogram comparison, etc. | |||
Data processing software | Qualitative and quantitative analysis of material phases , Kα1 ,α2 peeling, Full spectrum fitting, peak fitting, half-width and grain size calculation, crystal cell measuring, second kind stress calculation, diffraction line indexation, multiple plotting, 3D plotting, diffraction data calibration, background subtraction, quantitative analysis without standards, full spectral image fitting (WPF), XRD diffraction image simulation, etc. | ||||
Scattered radiation protection |
Lead+ lead glass protection, shutter windows and protective guard linkage, the scattered radiation is no more than 1μSv/h. | ||||
Overall stability | ≤1‰ | ||||
Sample quantity of one-time loading | Auto sample changer, 6 samples can be loaded a time. | ||||
Overall dimension | W 600×D 410×H 670(mm) | ||||
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Item | Components | Qty | Remark | ||
X-ray high-voltage generator | XRD40*600 X-ray generator | 1 set | high-frequency high-voltage | ||
X27.06 high-voltage cable(75kVP) | 1 Pc | Length:2.0 meter | |||
3311 pipe sleeve (including automatic optical shutter) | 1 set | ||||
X25.02 stage(Metal shell) | 1 set | Lead+ lead glass protection | |||
Metal ceramic X-ray tube | 1 set | Cu target, 2.4kW | |||
Angle measurement system | DG-3511 goniometer | 1 set | θ-θ structure | ||
Slit and powder sample holder | 1 set | One set for each | |||
Through-hole sample plate | 10 Pcs | Aluminium matrix | |||
Blind-hole sample plate | 15 Pcs | Glass matrix | |||
Filter | 1 Pc | Match with target material | |||
Slit plate and lighting system adjustment accessories | 1 set | ||||
Recording and controlling system | Closed proportional counter | 1 set | Including 1 connecting cable | ||
Recording and controlling unit | 1 set | ||||
Motor and communication cable | 1 Pc | 2 motor cables, 1 communication cable | |||
Power supply unit | 1 set | ||||
PC system | Dell laptop; I3 processor; RAM:4G; Hard drive: 500G; | 1 set | DELL | ||
A4 laser printer | 1 set | ||||
System Control and Applicable Software | AL Series Diffractometer Control Program Software | 1 set | Windows 10 | ||
Diffraction data processing software | 1 set | JADE 6.0 | |||
Diffraction data card base | 1 set | ||||
Crystal Structure Data Base | 1 set | ||||
Technical documents | User manual | 1 copy | |||
Data Processing and Application Software User Manual | 1 copy | ||||
Spare parts | Fuses 1,1.5,2, 2.5,3,3+(A) | 10 Pcs | 10 pieces for each | ||
Tools | 1 set | ||||
Agate Mortar ф100mm | 1 set |